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Atomic force microscope (AFM) test.

The surface morphology of the sample was measured by probe.

The device model is OLYMPUS LEXT OLS4500.


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The service is introduced:

The surface morphology of the sample was measured by probe.

The device model is OLYMPUS LEXT OLS4500.


The service content:

The surface morphology of the sample was observed.

Service description:

Customer needs to provide: observation base.


Experiment period: the customer observed/commissioned observation under the guidance of the engineer.


Charge standard: xx yuan/hour; Special pieces will be negotiated separately.


Results show: