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Spectroscopic ellipsometer SENresearch

The surface film parameters of the sample are measured by elliptical polarized light, such as film thickness and refractive index.

The device model is SENresearch 4.0. Spectral band 190nm-1700nm.


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The service is introduced:

The surface film parameters of the sample are measured by elliptical polarized light, such as film thickness and refractive index.

The device model is SENresearch 4.0. Spectral band 190nm-1700nm.


The service content:

Sample surface film test.


Service description:

Customer needs to provide : observation base. And provide the film parameter range.


Experiment period: the customer observed/commissioned observation under the guidance of the engineer.


Charge standard: xx yuan/hour; Special pieces will be negotiated separately.


Results show: