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Field Emission Scanning Electron Microscope

The image of high resolution, high contrast and high signal-to-noise ratio can be obtained by means of secondary electronic detection and backscatter electronic detection.


The device model is ZEISS GeminiSEM 500, the maximum acceleration voltage is 30kV. The resolution of 15kV is 0.6nm.


The Oxford Aztec Xmax 50 X ray spectrometer can be used for component analysis.


For the base with poor conductivity, PECS pretreatment can be used, and the model is Gatan Model685.


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The service is introduced:

The image of high resolution, high contrast and high signal-to-noise ratio can be obtained by means of secondary electronic detection and backscatter electronic detection.


The device model is ZEISS GeminiSEM 500, the maximum acceleration voltage is 30kV. The resolution of 15kV is 0.6nm.


The Oxford Aztec Xmax 50 X ray spectrometer can be used for component analysis.


For the base with poor conductivity, PECS pretreatment can be used, and the model is Gatan Model685.


The service content:

1. Observation of microstructure morphology.

2. Composition analysis of microregions (optional)


Service description:

Customer needs to provide: observation base. Special materials (such as ferromagnetic) need to be explained.


Experiment period: the customer observed/commissioned observation under the guidance of the engineer.


Charge standard: SEM xx yuan/hour; EDS function extra charge x * yuan; Additional charge for non-conducting substrate; Special pieces will be negotiated separately.


Results show: